Beam profiler
Single Plane XY Scanning Slit, 190 – 2500* nm
Port-powered USB 2.0
Features
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-> 190 to 1150 nm, Silicon detector
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-> 650 to 1800 nm, InGaAs detector
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-> 1000 to 2300 or 2500 nm, InGaAs (extended) detector
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-> Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode
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-> Port-powered USB 2.0; flexible 3 m cable, no power brick
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-> 0.1 µm sampling and resolution
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-> Linear & log X-Y profiles, centroid
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-> Profile zoom & slit width compensation
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-> Economical and accurate
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-> M©÷ option – beam propagation analysis, divergence, focus
Applications
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-> Laser printing & marking
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-> Medical lasers
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-> Diode laser systems
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-> Fiber optic telcom assembly focusing – LensPlate2¢â option for re-imaging waveguides and fiber ends
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-> Development, production, field service
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-> CW; Pulsed lasers, F µm = [500/(PRR in kHz)]
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-> M©÷ measurement with available M2DU stage
* model-dependent