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BeamMap2 – XYZ¥È¥Õ Scanning Slit Beam Profiler System


Multiple Z-plane XYZ¥È¥Õ Scanning Slit, 190 – 2500* nm

Port-powered USB 2.0

Features

  • -> 190 to 1150 nm, Silicon detector
  • -> 650 to 1800 nm, InGaAs detector
  • -> 1000 to 2300 or 2500 nm, InGaAs (extended) detector
  • -> Multiple plane spacing options available – please review this worksheet to identify the correct plane spacing for your application
  • -> Beam diameters 5 µm to 4 mm, to 2 µm in Knife Edge mode*
  • -> Port-powered USB 2.0; flexible 3 m cable, no power brick
  • -> 0.1 µm sampling and resolution
  • -> Linear & log X-Y profiles, centroid
  • -> Profile zoom & slit width compensation
  • -> Real-time multiple Z plane scanning slit system
  • -> Real-time XYZ profiles, Focus position
  • -> Real-time M©÷, Divergence, Collimation, Alignment

Applications

  • -> Laser printing & marking
  • -> Medical lasers
  • -> Diode laser systems
  • -> Fiber optic telcom assembly focusing – LensPlate2¢â option for re-imaging waveguides and fiber ends
  • -> Development, production, field service
  • -> CW; Pulsed lasers, F µm = [500/(PRR in kHz)]

* model-dependent

BeamMap2 puck schematic